Monet Solution

Our Monet for WLCSP is designed to incorporate the benefits of spring contact probe technology with the demands of wafer level packaging testing. The patent pending Monet solution allows for the robustness, replaceability and compliance of the spring probe while also addressing the fine pitches and coplanarity required for WLCSP.

Mechanical

  • Pitch Range: ≥ 200 µm
  • Height (test/rest): 2.92mm/3.32mm
  • Working spring force: 17 gf @ 0.40mm
  • Recommended travel: 0.40mm
  • Temperature: -55 ~150 °C

Electrical

  • Loop self inductance: 0.56 nH  
  • Mutual capacitance: 0.6 pF  
  • Bandwidth @-1dB: 10 GHz  
  • Contact resistance: < 180 mΩ 
  • Current carrying capability: ~ 1.5 A continuous
Specifications for ≥ 200 µm Pitch 
   150 µm available soon

Features

  • Well-suited to all WLCSP pitches ≥ 200 µm
  • Superior signal integrity
  • Reduced cost of ownership
  • End user serviceable
  • Turnkey solutions with fan-out PCB and Interposer allowing for use with existing higher pitch load board
  • Design and delivery within 6-8 weeks
  • Replaceable cartridges
  • Short Signal Path < 3mm
  • Stable C-Res over 500K cycles
1 of 2 Monet Solution

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